Junlin Hu

PhD Candidate
School of Electrical and Electronic Engineering (EEE)
Nanyang Technological University (NTU), Singapore
Email: JHU007 (AT) e.ntu.edu.sg

About Me

I am a PhD candidate at School of EEE in Nanyang Technological University, supervised by Prof. Yap-Peng Tan, and co-supervised by Prof. Jiwen Lu. I received my M.Eng in Pattern Recognition from Beijing Normal University, and B.Eng in Electronic and Information Engineering from Xi'an University of Technology, respectively.

Research

My research interests include computer vision, pattern recognition, and biometrics.

Publications

Google scholar citations

Junlin Hu, Jiwen Lu, Yap-Peng Tan. Sharable and Individual Multi-view Metric Learning. IEEE Transactions on Pattern Analysis and Machine Intelligence (T-PAMI), 2017.

Jiwen Lu, Junlin Hu, Jie Zhou. Deep Metric Learning for Visual Understanding. IEEE Signal Processing Magazine (SPM), 2017.

Junlin Hu, Jiwen Lu, Yap-Peng Tan, Junsong Yuan, Jie Zhou. Local Large-Margin Multi-Metric Learning for Face and Kinship Verification. IEEE Transactions on Circuits and Systems for Video Technology (T-CSVT), 2017. [pdf]

Junlin Hu, Yap-Peng Tan. Nonlinear Dictionary Learning with Application to Image Classification. Pattern Recognition (PR), 2017. [pdf]

Jiwen Lu, Junlin Hu, Yap-Peng Tan. Discriminative Deep Metric Learning for Face and Kinship Verification. IEEE Transactions on Image Processing (T-IP), vol. 26, no. 9, pp. 4269-4282, 2017. [pdf]

Junlin Hu, Jiwen Lu, Yap-Peng Tan, Jie Zhou. Deep Transfer Metric Learning. IEEE Transactions on Image Processing (T-IP), vol. 25, no. 12, pp. 5576-5588, 2016. [pdf]

Junlin Hu, Jiwen Lu, Yap-Peng Tan. Deep Metric Learning for Visual Tracking. IEEE Transactions on Circuits and Systems for Video Technology (T-CSVT), vol. 26, no. 11, pp. 2056-2068, 2016. [pdf]

Junlin Hu, Jiwen Lu, Yap-Peng Tan. Deep Transfer Metric Learning. IEEE Conference on Computer Vision and Pattern Recognition (CVPR), 2015. [pdf]

Junlin Hu, Jiwen Lu, Yap-Peng Tan. Fine-Grained Face Verification: Dataset and Baseline Results. International Conference on Biometrics (ICB), 2015. [pdf]

Junlin Hu, Jiwen Lu, Xiuzhuang Zhou, Yap-Peng Tan. Discriminative Transfer Learning for Single-Sample Face Recognition. International Conference on Biometrics (ICB), 2015. [pdf]

Junlin Hu, Jiwen Lu, Yap-Peng Tan. Discriminative Deep Metric Learning for Face Verification in the Wild. IEEE Conference on Computer Vision and Pattern Recognition (CVPR), 2014. [pdf]

Junlin Hu, Jiwen Lu, Junsong Yuan, Yap-Peng Tan. Large Margin Multi-Metric Learning for Face and Kinship Verification in the Wild. Asian Conference on Computer Vision (ACCV), 2014. [pdf]

Junlin Hu, Yongxin Ge, Jiwen Lu, Xin Feng. Makeup-Robust Face Verification. IEEE International Conference on Acoustics, Speech, and Signal Processing (ICASSP), 2013. [pdf] [data]

Renliang Weng, Jiwen Lu, Junlin Hu, Gao Yang, Yap-Peng Tan. Robust Feature Set Matching for Partial Face Recognition. IEEE International Conference on Computer Vision (ICCV), 2013. [pdf]

Jiwen Lu, Junlin Hu, Xiuzhuang Zhou, Yuanyuan Shang, Yap-Peng Tan, Gang Wang. Neighborhood Repulsed Metric Learning for Kinship Verification. IEEE Conference on Computer Vision and Pattern Recognition (CVPR), 2012. [pdf]

Download

The Kinship Face in the Wild (KinFaceW) database and results are available here: KinFaceW.
The Fine-Grained Face Verification (FGFV) dataset is provided upon request.
The Face Makeup (FAM) database is available here: FAM.

Services

Journal Reviewer
IEEE Transactions on Pattern Analysis and Machine Intelligence
IEEE Transactions on Image Processing
IEEE Transactions on Neural Networks and Learning Systems
IEEE Transactions on Circuits and Systems for Video Technology
IEEE Transactions on Information Forensics and Security
IEEE Transactions on Multimedia
IEEE Signal Processing Letters
IEEE Access
Pattern Recognition
Pattern Recognition Letters
Image and Vision Computing
Computer Vision and Image Understanding
Neurocomputing
Signal Processing
Information Fusion
Information Sciences
Journal of the Optical Society of America A (JOSA A)

Conference Reviewer
IEEE Winter Conference on Applications of Computer Vision (WACV), 2016, 2017, 2018
IEEE International Conference on Multimedia and Expo (ICME), 2015, 2016, 2017
IEEE International Conference on Image Processing (ICIP), 2017
IEEE International Conference on Robotics and Automation (ICRA), 2016
IEEE Visual Communications and Image Processing (VCIP), 2015, 2016, 2017
IEEE International Symposium on Circuits and Systems (ISCAS), 2015, 2016, 2017

Others